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Information card for entry 1567220
Preview
| Coordinates | 1567220.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | bis((1,4-Dioxanediyl-2,3-dithio)ethylene-dithiotetrathiafulvalene) tetraoxo-rhenium(VI) |
|---|---|
| Formula | C24 H20 O8 Re S16 |
| Calculated formula | C24 O8 Re S16 |
| Title of publication | Influence of Packing of Radical Cations on the Conductivity of the New Molecular Semiconductor (Doet)2ReO4 |
| Authors of publication | Gritsenko, V. V.; D'yachenko, O. A.; Kotov, A. I.; Buravov, L. I.; Mizuno, M. |
| Journal of publication | Russian Journal of Coordination Chemistry |
| Year of publication | 2001 |
| Journal volume | 27 |
| Journal issue | 6 |
| Pages of publication | 401 - 406 |
| a | 9.04 ± 0.002 Å |
| b | 12.744 ± 0.004 Å |
| c | 16.14 ± 0.004 Å |
| α | 80.22 ± 0.02° |
| β | 88.87 ± 0.02° |
| γ | 78.67 ± 0.02° |
| Cell volume | 1796.5 ± 0.8 Å3 |
| Ambient diffraction temperature | 295 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.089 |
| Weighted residual factors for all reflections included in the refinement | 0.191 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 276545 (current) | 2022-07-04 | cif/ Adding structures of 1567220 via cif-deposit CGI script. |
1567220.cif |
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