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Information card for entry 1573865
Preview
Coordinates | 1573865.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Poly[[bis(μ~4~-acetato-κ^4^<i>O</i>:<i>O</i>:<i>O</i>':<i>O</i>')tetrakis(μ~3~-acetato-κ^3^<i>O</i>:<i>O</i>:<i>O</i>')bis(μ~2~-acetato-κ^2^<i>O</i>:<i>O</i>')bis(μ~3~-hydroxido)pentanickel(II)] 2.60-hydrate] |
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Formula | C16 H31.2 Ni5 O20.6 |
Calculated formula | C16 H26 Ni5 O20.602 |
Title of publication | Poly[[bis(μ4-acetato-κ4 O:O:O′:O′)tetrakis(μ3-acetato-κ3 O:O:O′)bis(μ2-acetato-κ2 O:O′)bis(μ3-hydroxido)pentanickel(II)] 2.60-hydrate] |
Authors of publication | Pfeiffer, Maximilian; Stöger, Berthold; Weil, Matthias |
Journal of publication | IUCrData |
Year of publication | 2025 |
Journal volume | 10 |
Journal issue | 2 |
a | 23.3025 ± 0.0011 Å |
b | 23.3025 ± 0.0011 Å |
c | 11.2648 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6116.9 ± 0.5 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.0926 |
Residual factor for significantly intense reflections | 0.0376 |
Weighted residual factors for significantly intense reflections | 0.0626 |
Weighted residual factors for all reflections included in the refinement | 0.0688 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.826 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
297641 (current) | 2025-02-08 | cif/ Adding structures of 1573865 via cif-deposit CGI script. |
1573865.cif |
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Users of the data should acknowledge the original authors of the
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